Aswendt, Petra: search on Z-Library

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1

Hologram reconstruction using a digital micromirror device

Journal:

Optical Engineering

Year:

2001

Language:

english

File:

PDF, 298 KB

english, 2001

2

Dynamic foot scanning: A new approach for measurement of the human foot shape while walking

Schmeltzpfenning, Timo, Plank, Clemens, Krauss, Inga, Aswendt, Petra, Grau, Stefan

Journal:

Footwear Science

Year:

2009

Language:

english

File:

PDF, 368 KB

english, 2009

3

3D dynamic behaviour of foot structure may provide additional information for last design

Schmeltzpfenning, Timo, Plank, Clemens, Fritz, Bettina, Aswendt, Petra, Grau, Stefan

Journal:

Footwear Science

Year:

2011

Language:

english

File:

PDF, 140 KB

english, 2011

4

Speckle interferometry for materials testing under extreme thermal conditions

Petra Aswendt, Roland Höfling

Journal:

Year:

1998

Language:

english

File:

PDF, 985 KB

english, 1998

5

SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Microsystems Engineering: Metrology and Inspection - Inspection system for MEMS characterization on wafer level using ESPI

Aswendt, Petra, Schmidt, Claus-Dieter, Zielke, Dirk, Schubert, Steffen, Gorecki, Christophe, Jueptner, Werner P. O., Kujawinska, Malgorzata

Year:

2001

Language:

english

File:

PDF, 1005 KB

english, 2001

6

SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] Interferometry VII: Techniques and Analysis - New approach to the optimization of HNDT applications

Aswendt, Petra, Kujawinska, Malgorzata, Pryputniewicz, Ryszard J., Takeda, Mitsuo

Year:

1995

Language:

english

File:

PDF, 787 KB

english, 1995

7

Interferometric studies on thermal expansion behaviour of carbon fibre-reinforced composites

Roland Höfling, Petra Aswendt

Journal:

Year:

1993

Language:

english

File:

PDF, 605 KB

english, 1993

8

SPIE Proceedings [SPIE SPIE MOEMS-MEMS: Micro- and Nanofabrication - San Jose, CA (Saturday 24 January 2009)] Emerging Digital Micromirror Device Based Systems and Applications - Real-time 3D shape recording by DLP-based all-digital surface encoding

Höfling, Roland, Hornbeck, Larry J., Douglass, Michael R., Aswendt, Petra

Year:

2009

Language:

english

File:

PDF, 665 KB

english, 2009

9

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Industrial inspection of specular surfaces using a new calibration procedure

Aswendt, Petra, Hofling, Roland, Gartner, Soren, Osten, Wolfgang, Gorecki, Christophe, Novak, Erik L.

Year:

2005

Language:

english

File:

PDF, 2.36 MB

english, 2005

10

SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Optical Inspection and Micromeasurements - Steps toward the use of DSPI for high-temperature strain measurement

Aswendt, Petra, Hoefling, Roland, Gorecki, Christophe

Year:

1996

Language:

english

File:

PDF, 867 KB

english, 1996

11

SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Micro- and Nanometrology in Manufacturing Technology - Analysis of static and dynamic operational behavior of active micromembranes

Aswendt, Petra, Gorecki, Christophe, Asundi, Anand K., Dean, Thierry

Year:

2004

Language:

english

File:

PDF, 1.21 MB

english, 2004

12

SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Optical Measurement Systems for Industrial Inspection - Shape measurement in sheet metal formation: requirements and solutions

Hoefling, Roland, Aswendt, Petra, Neugebauer, Reimund, Kujawinska, Malgorzata, Osten, Wolfgang

Year:

1999

Language:

english

File:

PDF, 1.07 MB

english, 1999

13

SPIE Proceedings [SPIE Symposium on Micromachining and Microfabrication - Santa Clara, CA (Monday 20 September 1999)] Materials and Device Characterization in Micromachining II - Optical full-field technique for measuring deflection and strain on micromechanical components

Aswendt, Petra, Hoefling, Roland, Hiller, Karla, Vladimirsky, Yuli, Friedrich, Craig R.

Year:

1999

Language:

english

File:

PDF, 2.28 MB

english, 1999

14

SPIE Proceedings [SPIE International Conference on Applied Optical Metrology - Balatonfured, Hungary (Monday 8 June 1998)] International Conference on Applied Optical Metrology - Experimental and numerical analysis of the thermal deformation of composite tubes

Holstein, Daniel, Aswendt, Petra, Hoefling, Roland, Schmidt, Claus-Dieter, Jueptner, Werner P. O., Rastogi, Pramod K., Gyimesi, Ferenc

Year:

1998

Language:

english

File:

PDF, 1.30 MB

english, 1998

15

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 7 February 2015)] Emerging Digital Micromirror Device Based Systems and Applications VII - Characteristics of digital micromirror projection for 3D shape measurement at extreme speed

Douglass, Michael R., King, Philip S., Lee, Benjamin L., Höfling, Roland, Aswendt, Petra, Leischnig, Frank, Förster, Matthias

Year:

2015

Language:

english

File:

PDF, 5.04 MB

english, 2015

16

SPIE Proceedings [SPIE Speckle Metrology 2003 - Trondheim, Norway (Wednesday 18 June 2003)] Speckle Metrology 2003 - Promise and challenge of DUV speckle interferometry

Year:

2003

Language:

english

File:

PDF, 479 KB

english, 2003

17

ESPI solution for non-contacting MEMS-on-wafer testing

Petra Aswendt, Claus-Dieter Schmidt, Dirk Zielke, Steffen Schubert

Journal:

Optics and Lasers in Engineering

Year:

2003

Language:

english

File:

PDF, 1.35 MB

english, 2003

18

SPIE Proceedings [SPIE Lasers and Optics in Manufacturing III - Munich, Germany (Monday 16 June 1997)] Lasers in Material Processing - Application of a high-power diode laser for laser bending

Lopez Cutino, Daniela, Dubslaff, Joerg, Hoefling, Roland, Aswendt, Petra, Beckmann, Leo H. J. F.

Year:

1997

Language:

english

File:

PDF, 1.09 MB

english, 1997

19

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Microsystems Engineering: Metrology and Inspection III - Micromotion analysis by deep-UV speckle interferometry

Aswendt, Petra, Gorecki, Christophe

Year:

2003

Language:

english

File:

PDF, 780 KB

english, 2003

20

SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Microsystems Metrology and Inspection - Testing microcomponents by speckle interferometry

Aswendt, Petra, Hoefling, Roland, Hiller, Karla, Gorecki, Christophe

Year:

1999

Language:

english

File:

PDF, 3.22 MB

english, 1999

21

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Laser Interferometry IX: Applications - Simulation and experiment on the thermal deformation of composite tubes

Holstein, Daniel, Aswendt, Petra, Hoefling, Roland, Schmidt, Claus-Dieter, Jueptner, Werner P. O., Pryputniewicz, Ryszard J., Brown, Gordon M., Jueptner, Werner P. O.

Year:

1998

Language:

english

File:

PDF, 3.14 MB

english, 1998

22

SPIE Proceedings [SPIE ECO4 (The Hague '91) - The Hague, Netherlands (Monday 11 March 1991)] Industrial Applications of Holographic and Speckle Measuring Techniques - DSPI: a tool for analyzing thermal strain on ceramic and composite materials

Hoefling, Roland, Aswendt, Petra, Totzauer, Werner F., Jueptner, Werner P. O., Jueptner, Werner P. O.

Year:

1991

Language:

english

File:

PDF, 578 KB

english, 1991

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